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| Semester | fall semester 2009 |
| Lecturers |
Thilo Glatzel (thilo.glatzel@unibas.ch)
Enrico Gnecco (enrico.gnecco@unibas.ch) Thomas Jung (thomas.jung@unibas.ch, Assessor) Ernst Meyer (ernst.meyer@unibas.ch) Meike Stöhr (meike.stoehr@unibas.ch) |
| Content | Analysemethoden wie LEED, Auger, XPS, UPS, Massenspektroskopie, EELS, FIM, STM, AFM sowie die wichtigsten Präparationsmethoden unter Ultrahochvakuumbedingugen werden behandelt. |
| Learning objectives | Die wichtigsten Methoden der Oberflächenphysik werden behandelt. |
| Language of instruction | German |
| Use of digital media | No specific media used |
| Course auditors welcome |
| Interval | Weekday | Time | Room |
|---|
No dates available. Please contact the lecturer.
| Modules |
Module Specialisation: Physics (Master Physics) Module Specialisation: Physics (Master Nanosciences) |
| Assessment format | continuous assessment |
| Assessment registration/deregistration | Reg.: course registration; dereg.: teaching staff |
| Repeat examination | no repeat examination |
| Scale | 1-6 0,5 |
| Repeated registration | as often as necessary |
| Responsible faculty | Faculty of Science, studiendekanat-philnat@unibas.ch |
| Offered by | Departement Physik |